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InfoResearchPeer-reviewed

Logic-Embedded PUF With Periphery-Free and Synthesized Implementation for Low Design and Area Cost IoT Security

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Summary

Researchers propose logic-embedded physically unclonable functions (Logic-ePUFs), which replace scan flip-flops and buffers in a semi-custom design flow so the cells act as both standard logic and a PUF for secure key generation. The FF-ePUF and BUF-ePUF were fabricated in 28nm and achieve a bit error rate of 178 ppm with area overhead of 332-447 F2/bit for the FF-ePUF. The BUF-ePUF reduces area overhead by 41% compared to conventional methods.